| |
-
book
 VLSI Test Principles and Architectures: Design for Testability
This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the future fundamentals.
The comprehensive review of future test technology trends, including self-repair, soft error protection, MEMS testing, and RF testing, leads students and researchers to advanced DFT research.
preview:
http://www.amazon.com
8/7/2006
Tags: design-for-test
 |
