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article
 Integrated BIST simplifies system design
Awareness of different types of subsystem-level Built-In Self Test (BIST) can simplify the system-level design process in mission-critical applications where system reliability is paramount, and “failure is not an option.” Key BIST benefits include the ability to meet Size, Weight, and Power (SWaP) requirements while increasing Mean Time Between Failure (MTBF) and reducing hardware and software overhead.
preview:
http://www.vmecritical.com
4/29/2009
Tags: debugger
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