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National Instruments Online Seminar Archive
Archive of online seminars: PC-Based Real-Time Technologies * Internet-based Virtual Instruments * Making Your Applications Year 2000 Ready * ActiveX Technologies and Their Impact on Measurement and Automation * PC-Based Real-Time Technologies (36 min) - July 28, 1999 * Real-time needs vary based on your measurement and automation application.
preview:
http://sine.ni.com
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webinar
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A True Differential Millimeter Wave System with Port Power Control
As existing millimeter wave vector network analyzer systems, which allow for control of port power, becomes obsolete and the need for controlling the port power continues to grow there is an increased need for a solution to meet this measurement capability.
In this webcast we will address the reasons for controlling the power at the port of a device and review some of the basic techniques to control power.
Following this initial introduction...
preview:
http://www.techonline.com
date: 3/18/2009
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webinar
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Anatomy of Jitter
There are a large number of different jitter measurements from period and phase jitter measurements, to jitter decomposition and BER analysis.
This 1 hour webinar will define the categories and types of jitter and how each of these measurements might be applicable to your task or application.
Presenter: Jit Lim, Senior Technologist for High Speed Signal Analysis, Tektronix Jit Lim has an Electrical Engineering degree from the...
preview:
http://www.eetimes.com
date: 11/11/2010
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webinar
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Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity: How to Make the Most …
Digital storage oscilloscopes (DSO) are the primary tools used today by digital designers to perform signal integrity measurements such as setup/hold times, rise/fall times, and eye margin tests.
High performance oscilloscopes are also widely used in university research labs to accurately characterize high-speed digital devices and systems, as well as to perform high energy physics experiments such as pulsed laser testing.
In addition,...
preview:
http://www.techonline.com
date: 5/5/2010
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webinar
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Hall Effect Measurements Fundamentals
This seminar will introduce the topic of Hall Effect measurements as they relate to semiconductor materials and device characterization.
Hall Effect measurement systems are commonly used to determine semiconductor parameters, such as carrier mobility and carrier concentration, Hall coefficient, and conductivity and conductivity type.
preview:
https://event.on24.com
date: 2/19/2009
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