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MeshNetics - 802.15.4 / ZigBee Wireless RF Modules
MeshNetics is a creator of easy-to-integrate 802.15.4 / ZigBee wireless RF modules and ZigBee PRO-certified mesh networking software, used by OEMs and system integrators to add wireless connectivity to their products and solutions. MeshNetics RF modules feature industry-leading range performance, long battery life and ultra-small footprint. They are designed for use in 868/915 MHz and 2.4 GHz frequency bands. MeshNetics is a single source of ZigBee modules, development tools, networking software, technical support, and design services.
MeshNetics - 802.15.4 / ZigBee Wireless RF Modules

 

 

book   1-5 star rating for this site  
Design and Test for Multiple Gbps Communication Devices and Systems
This book deals with the latest and outstanding practical physical layer issues and solutions of high speed communication systems. Widely ranging topics in different disciplines such as Tx/Rx architecture, EM-modeling, entire-path simulation, system level jitter transfer modeling, jitter measurement with model-based inversion, etc. are discussed in a orderly and comprehensive manner. Readers will benefit a lot from Dr Li's superior effort...
Click here to preview in another window preview: http://www.amazon.com   date: 11/1/2005

book   1-5 star rating for this site  
Design of Systems on a Chip: Design and Test
Second of two volumes addressing the design challenges associated with new generations of the semiconductor technology. The various chapters are the compilations of tutorials presented at workshops in the recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip. In...
Click here to preview in another window preview: http://www.amazon.com   date: 10/3/2006

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book   1-5 star rating for this site  
Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow
current trend in digital design-the integration of the MATLAB® components Simulink® and Stateflow® for model building, simulations, system testing, and fault detection-allows for better control over the design flow process and, ultimately, for better system results. Digital Integrated Circuits: Design-for-Test Using Simulink® and Stateflow® illustrates the construction of Simulink models for digital project test benches in certain...
Click here to preview in another window preview: http://www.amazon.com   date: 11/2/2006

book   1-5 star rating for this site  
System-on-Chip Test Architectures (Systems on Silicon)
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today?s overall product cost. This book is a comprehensive...
Click here to preview in another window preview: http://www.amazon.com   date: 11/16/2007

book   1-5 star rating for this site  
Test and Design-for-Testability in Mixed-Signal Integrated Circuits
Deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for...
Click here to preview in another window preview: http://www.amazon.com   date: 10/18/2004

book   1-5 star rating for this site  
VLSI Test Principles and Architectures: Design for Testability
This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the future fundamentals. The comprehensive review of future test technology trends, including self-repair, soft error protection, MEMS testing, and RF testing, leads students and researchers to advanced DFT research.
Click here to preview in another window preview: http://www.amazon.com   date: 7/7/2006

eSOL’s Multi-core ready RTOS


eSOL’s Multi-core ready RTOS. The eT-Kernel Multi-Core Edition supports two scheduling modes, True SMP Mode (TSM) and Single Processor Mode (SPM). Both provide software developers with a blended multiprocessor RTOS, and the scalability and high throughput efficiency of SMP, with the more deterministic and realtime characteristics of AMP. All this is within a single tightly-coupled multiprocessor solution supporting POSIX 1003.1. 2004.
eSOL’s Multi-core ready RTOS


 

 

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